Contact
How to shop
Delivery
Shopping guide
Forces in Scanning Probe Methods
English
820 b
Up to 30 days for returns
Customers also purchased
/
Paperback
55.73
€
/
Paperback
16.45
€
The invention of scanning tunneling microscopy, atomic force microscopy and near field optical microscopy has opened up a new field of research: scanning probe methods (SMP). The quality of image acquisition has made great strides in recent times, but many fundamental, unsolved problems remain unanswered about the interaction between probe tip and sample. Forces in Scanning Probe Methods contains 60 contributions dedicated to these problems. Most of the contributions are reviews, presenting condensed, relevant information, suitable for both students and specialists. The contributions cover the instrumental aspects and design of force microscopes in different environments (ambient pressure, low temperature, ultrahigh vacuum, liquids). Theory is also covered, including ab initio calculations and molecular dynamics simulations. Mechanical properties at micro and nanoscales receive intensive treatment, including adhesion, friction and wear: the friction phenomenon is one of the most hotly debated questions. Other highlights include advances in near field optical microscopy and its relation to forces, the application of force microscopy in NMR, and the observance of flux lines in high Tc superconductors. Recent advances in biology and chemistry also attract attention.
About the book
English
Give this book today
It's easy
1 Add to cart and choose Deliver as present at the checkout 2 We'll send you a voucher 3 The book will arrive at the recipient's addressYou might also be interested in
/
Hardback
32.50
€
/
Paperback
12.11
€
/
Paperback
205.36
€
/
Paperback
14.53
€
Hi! I'm Libroamiko, your book advisor.
How can I help you?